TITLE

Rectification of force-distance curve using capacitance measurement

AUTHOR(S)
Naitou, Y.; Ogiso, H.; Ookubo, N.
PUB. DATE
February 2009
SOURCE
Applied Physics Letters;2/23/2009, Vol. 94 Issue 8, p083104
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We demonstrate the rectification of force spectroscopy in noncontact atomic force microscopy. The resonant frequency shift (Δf) in the probe oscillation and distance-modulated capacitance (dC/dZ) are simultaneously measured on thin dielectric films as a function of externally applied bias voltage and tip-sample distance Z. Analysis of dC/dZ spectroscopy has revealed that the probe-tip position shifts due to the attractive force acting between the tip and a sample. We show that the shifted Δf-Z curve can be rectified and the deformation of the probe tip can be quantitatively assessed.
ACCESSION #
43230348

 

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