TITLE

Study of boron diffusion in MgO in CoFeB|MgO film stacks using parallel electron energy loss spectroscopy

AUTHOR(S)
Mukherjee, Sankha S.; MacMahon, David; Feiming Bai; Chih-Ling Lee; Kurinec, Santosh K.
PUB. DATE
February 2009
SOURCE
Applied Physics Letters;2/23/2009, Vol. 94 Issue 8, p082110
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Boron diffusion in MgO has been investigated in annealed film stacks of sputtered CoFeB|MgO using transmission electron microscopy and parallel electron energy loss spectroscopy. The analyses show significant B movement when the films are annealed, with the formation of BOx complexes. Characteristic diffusion lengths have been estimated in films annealed at the commonly employed temperature range of 300–400 °C for the fabrication of magnetic tunnel junctions. An activation energy of 1.3 eV (±0.4 eV) has been extracted from these data that represent B diffusion in MgO through vacancies and defect states mediated by the formation of BOx complexes.
ACCESSION #
43230265

 

Related Articles

  • POLYMER-DERIVED SiOC CERAMICS; MORE QUESTIONS THAN ANSWERS. KLEEBE, Hans-Joachim; GREGORI, Giuliano // Anadolu University Journal of Sciences & Technology;2009, Vol. 10 Issue 1, p19 

    Polymer derived SiOC ceramics (PDCs), with a rather high intrinsic carbon content, were characterized by transmission electron microscopy (TEM). One focus of this study was to highlight specific strengths as well as limitations of TEM specific techniques with high lateral resolution such as...

  • Incorporation of Sb in InAs/GaAs quantum dots. Molina, S. I.; Sánchez, A. M.; Beltrán, A. M.; Sales, D. L.; Ben, T.; Chisholm, M. F.; Varela, M.; Pennycook, S. J.; Galindo, P. L.; Papworth, A. J.; Goodhew, P. J.; Ripalda, J. M. // Applied Physics Letters;12/24/2007, Vol. 91 Issue 26, p263105 

    The formation of a quaternary InGaAsSb alloy is shown to occur in the core of epitaxial GaSb capped InAs/GaAs quantum dots emitting at 1.3 μm. The existence of the four constituent elements is demonstrated by using spatially resolved low-loss electron energy loss spectroscopy and...

  • A TEM study of nanoparticles in lustre glazes. Fredrickx, P.; Hélary, D.; Schryvers, D.; Darque-Ceretti, E. // Applied Physics A: Materials Science & Processing;2004, Vol. 79 Issue 2, p283 

    Transmission electron microscopy (TEM) has been used to investigate the nanoscale morphology of some contemporary lustre glazes. High-resolution TEM, electron energy-loss spectroscopy and energy-dispersive X-ray analysis data imply that two kinds of nanoparticles are present in the lustre layer,...

  • Compositional and valent state inhomogeneities and ordering of oxygen vacancies in terbium-doped ceria. Ye, Fei; Mori, Toshiyuki; Ou, Ding Rong; Zou, Jin; Auchterlonie, Graeme; Drennan, John // Journal of Applied Physics;6/1/2007, Vol. 101 Issue 11, p113528 

    Intragranular distributions of composition and valent state in sintered Tb-doped ceria have been systematically investigated. Through detailed studies of electron energy loss spectroscopy and energy filtering transmission electron microscopy, both compositional and valent state inhomogeneities...

  • Frank dislocation loops in HgTe/CdTe superlattices on CdTe/Si(211)B substrates. Fu, L. F.; Okamoto, N. L.; Chi, M. F.; Browning, N. D.; Jung, H. S.; Grein, C. H. // Journal of Applied Physics;Jul2008, Vol. 104 Issue 2, p023104 

    The defect structures in HgTe/CdTe superlattices (SLs) on CdTe/Si(211)B substrates grown by molecular-beam epitaxy have been investigated using (scanning) transmission electron microscopy and electron energy loss spectroscopy. Straight Hg-rich defects perpendicular to the SLs have been observed...

  • Structural and compositional characterization of a Co/Re multilayer and superlattice. Xu, Wentao; De Long, Lance E.; Charlton, Timothy; Chisholm, Matthew; Lederman, David // Journal of Applied Physics;5/15/2007, Vol. 101 Issue 10, p103920 

    The structure and composition of a Co/Re trilayer and a 19-period superlattice were characterized by high-resolution transmission electron microscopy (TEM) and scanning TEM (STEM). Low-angle x-ray reflectivity measurements were performed and compared with the TEM results. The Re and Co layers...

  • Practical aspects of monochromators developed for transmission electron microscopy. Kimoto, Koji // Microscopy;Oct2014, Vol. 63 Issue 5, p337 

    A few practical aspects of monochromators recently developed for transmission electron microscopy are briefly reviewed. The basic structures and properties of four monochromators, a single Wien filter monochromator, a double Wien filter monochromator, an omega-shaped electrostatic monochromator...

  • Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals. Yusuke Sasano; Shunsuke Muto // Journal of Electron Microscopy;Oct2008, Vol. 57 Issue 5, p149 

    The demand for analysis of trace elements in atomically localized areas by electron energy-loss spectroscopy (EELS) in transmission electron microscopy is increasing. Unfortunately, the prolonged data acquisitions required to achieve an acceptable signal-to-noise ratio (SNR) tend to deteriorate...

  • The multilayered structure of ultrathin amorphous carbon films synthesized by filtered cathodic vacuum arc deposition. Wang, Na; Komvopoulos, Kyriakos // Journal of Materials Research;Aug2013, Vol. 28 Issue 16, p2124 

    The structure of ultrathin amorphous carbon (a-C) films synthesized by filtered cathodic vacuum arc (FCVA) deposition was investigated by high-resolution transmission electron microscopy, electron energy loss spectroscopy, and x-ray photoelectron spectroscopy. Results of the plasmon excitation...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics