TITLE

Relative free energies of Si surfaces

AUTHOR(S)
Follstaedt, D.M.
PUB. DATE
March 1993
SOURCE
Applied Physics Letters;3/8/1993, Vol. 62 Issue 10, p1116
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Investigates the relative free energies in the faceted cavities of silicon (Si) surfaces. Use of Fourier transform infrared spectroscopy in determining hydrogen bond strength; Examination of faceting on helium-implanted metals; Effect of high temperature on internal surface equilibration.
ACCESSION #
4323012

 

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