Interpretation of photoluminescence excitation spectroscopy of porous Si layers

Lei Wang; Wilson, M.T.; Haegel, N.M.
March 1993
Applied Physics Letters;3/8/1993, Vol. 62 Issue 10, p1113
Academic Journal
Examines the interpretation of photoluminescence (PL) excitation spectroscopy of porous silicon (Si) layers. Distinction between the processes involved in PL generation; Effect of PL on quantum confinements within crystalline Si wires; Conversion of the hydride Si surface to contaminated Si oxides.


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