Microscale elastic-strain determination by backscatter Kikuchi diffraction in the scanning

Troost, K.Z.; van der Sluis, P.; Gravesteijn, D.J.
March 1993
Applied Physics Letters;3/8/1993, Vol. 62 Issue 10, p1110
Academic Journal
Examines the microscale elastic-strain determination using a backscatter Kikuchi diffraction (BKD) in the scanning electron microscope. Significance of the higher-order Laue zone in determining indium layer strain; Effect of gnomonic projection on Kikuchi bands; Application of cross-correlation operation in the poles of BKD patterns.


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