Flux penetration into YBa[sub 2]Cu[sub 3]O[sub x] thin films covering substrate step edges

Schuster, Th.; Koblischka, M.R.; Kuhn, H.; Kronmuller, H.; Friedl, G.; Roas, B.; Schultz, L.
February 1993
Applied Physics Letters;2/15/1993, Vol. 62 Issue 7, p768
Academic Journal
Observes the magnetic flux penetration into YBa[sub 2]Cu[sub 3]O[sub x] thin film grown over substrate step edges. Use of high-resolution Faraday effect technique; Factors causing the easy flux penetration; Determination of the critical current density; Influence of defect on the domain pattern of the thin film.


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