Distance control in near-field optical microscopy with piezoelectrical shear-force detection

Brunner, R.; Bietsch, A.; Hollricher, O.; Marti, O.
April 1997
Review of Scientific Instruments;Apr97, Vol. 68 Issue 4, p1769
Academic Journal
Introduces an improved piezoelectric shear-force feedback system for tip-sample distance control in a scanning near-field optical microscope. Piezoelectrical shear-force setup; Fiber amplitude; Topographical resolution obtained; Measurements in water.


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