A new x-ray diffraction method for structural investigations of solid-liquid interfaces

Huisman, Willem Jan; Peters, J.F.; Derks, J.W.; Ficke, H.G.; Abernathy, D.L.; van der Veen, J.F.
November 1997
Review of Scientific Instruments;Nov97, Vol. 68 Issue 11, p4169
Academic Journal
Presents a synchrotron x-ray diffraction method for structural investigations of interfaces between low-Z substrates and heavier liquids. Illumination of the interface through the solid substrate; Backgrounds arising from bulk scattering and the signal-to-background ratio.


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