Precise force curve detection system with a cantilever controlled by magnetic force feedback

Yamamoto, Shin-ichi; Yamada, Hirofumi; Tokumoto, Hiroshi
November 1997
Review of Scientific Instruments;Nov97, Vol. 68 Issue 11, p4132
Academic Journal
Presents the development of an atomic force microscope (AFM) with an externally controllable force using an electromagnet. Control of the position of the AFM cantilever by the external magnetic field of an electromagnet; Use of an optical detection system; Implementation of a magnetic force feedback system.


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