Precise force curve detection system with a cantilever controlled by magnetic force feedback

Yamamoto, Shin-ichi; Yamada, Hirofumi; Tokumoto, Hiroshi
November 1997
Review of Scientific Instruments;Nov97, Vol. 68 Issue 11, p4132
Academic Journal
Presents the development of an atomic force microscope (AFM) with an externally controllable force using an electromagnet. Control of the position of the AFM cantilever by the external magnetic field of an electromagnet; Use of an optical detection system; Implementation of a magnetic force feedback system.


Related Articles

  • A variable temperature ultrahigh vacuum atomic force microscope. Dai, Q.; Vollmer, R.; Carpick, R.W.; Ogletree, D.F.; Salmeron, M. // Review of Scientific Instruments;Nov95, Vol. 66 Issue 11, p5266 

    Describes an atomic force microscope that operates in ultrahigh vacuum (UHV). Force detection scheme; Optical alignment; Instrumentation and design; Imaging at and below room temperature.

  • High-frequency mechanical spectroscopy with an atomic force microscope. Dupas, E.; Gremaud, G.; Kulik, A.; Loubet, J.-L. // Review of Scientific Instruments;Oct2001, Vol. 72 Issue 10, p3891 

    In this article we further develop local mechanical spectroscopy and extend the frequency range over which it can be used. Using a heterodyne method to measure the deflection of the cantilever enables one to measure the probe vibration at any frequency. Since the detection sensitivity of force...

  • Design and construction of a heat stage for investigations of samples by atomic force microscopy above ambient temperatures. Baekmark, Thomas Rosleff; Bjornholm, Thomas; Mouritsen, Ole G. // Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p140 

    Reports on the design and construction of a heat stage to be used together with a commercially available atomic force microscope for direct heating of sample and cantilever. Instrumentation; Monitoring of the ambient temperature; Atomic resolutions.

  • Calibration of atomic-force microscope tips. Hutter, Jeffrey L.; Bechhoefer, John // Review of Scientific Instruments;Jul1993, Vol. 64 Issue 7, p1868 

    Images and force measurements taken by an atomic-force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample's surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality...

  • Low-cost modification of a contact atomic force microscope (AFM) into a sound-activated tapping... Vinckier, Anja; Hennau, Frans; Kjoller, Kevin; Hellemans, Louis // Review of Scientific Instruments;Feb1996, Vol. 67 Issue 2, p387 

    Presents a low-cost implementation of tapping mode atomic force microscope (AFM) on a commercial instrument. Tapping mode AFM in air; Tapping mode AFM in liquid.

  • Scanned-cantilever atomic force microscope. Baselt, David R.; Baldeschwieler, John D. // Review of Scientific Instruments;Apr93, Vol. 64 Issue 4, p908 

    We have developed a 3.6 μm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds...

  • Real-time, interferometrically measuring atomic force microscope for direct calibration of standards Gonda, S.; Doi, T.; Kurosawa, T.; Tanimura, Y.; Hisata, N.; Yamagishi, T.; Fujimoto, H.; Yukawa, H. // Review of Scientific Instruments;Aug1999, Vol. 70 Issue 8, p3362 

    Develops an atomic force microscope with a high-resolution three-axis laser interferometer for real-time correction of distorted topographic images. Calibration of standard samples for a scanning probe microscope on the basis of stabilized wavelength of He-Ne lasers; Components of the scanner;...

  • Calibration of surface stress measurements with atomic force microscopy. Miyatani, Tatsuya; Fujihira, Masamichi // Journal of Applied Physics;6/1/1997, Vol. 81 Issue 11, p7099 

    An accurate method to calibrate a commercial atomic force microscope (AFM) with commercial cantilevers for surface stress measurements was investigated. The bending of commercial rectangular cantilevers of the AFM was measured by laser beam deflection under a concentrated load mode and a bending...

  • Force measurement using an ac atomic force microscope. Ducker, William A.; Cook, Robert F.; Clarke, David R. // Journal of Applied Physics;5/1/1990, Vol. 67 Issue 9, p4045 

    Presents a study that measured the amplitude-displacement-frequency spectra for a lever of an atomic force microscope. Determination of the surface forces in air; Analysis of the displacement and frequency scans; Comparison of force microscopes and surface forces apparatus.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics