TITLE

Precise force curve detection system with a cantilever controlled by magnetic force feedback

AUTHOR(S)
Yamamoto, Shin-ichi; Yamada, Hirofumi; Tokumoto, Hiroshi
PUB. DATE
November 1997
SOURCE
Review of Scientific Instruments;Nov97, Vol. 68 Issue 11, p4132
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents the development of an atomic force microscope (AFM) with an externally controllable force using an electromagnet. Control of the position of the AFM cantilever by the external magnetic field of an electromagnet; Use of an optical detection system; Implementation of a magnetic force feedback system.
ACCESSION #
4320583

 

Related Articles

  • Demonstration of low-temperature atomic force microscope with atomic resolution using piezoresistive cantilevers. Shiraki, Ichiro; Miyatake, Yutaka; Nagamura, Toshihiko; Miki, Kazushi // Review of Scientific Instruments;Feb2006, Vol. 77 Issue 2, p023705 

    Compared to current optical-lever methods adopted in atomic force microscopes, nonoptical methods such as piezoresistive methods and quartz fork methods can be more advantageous due to their smaller installation size and the lack of electromagnetic effects from laser light during electrical...

  • A variable temperature ultrahigh vacuum atomic force microscope. Dai, Q.; Vollmer, R.; Carpick, R.W.; Ogletree, D.F.; Salmeron, M. // Review of Scientific Instruments;Nov95, Vol. 66 Issue 11, p5266 

    Describes an atomic force microscope that operates in ultrahigh vacuum (UHV). Force detection scheme; Optical alignment; Instrumentation and design; Imaging at and below room temperature.

  • High-frequency mechanical spectroscopy with an atomic force microscope. Dupas, E.; Gremaud, G.; Kulik, A.; Loubet, J.-L. // Review of Scientific Instruments;Oct2001, Vol. 72 Issue 10, p3891 

    In this article we further develop local mechanical spectroscopy and extend the frequency range over which it can be used. Using a heterodyne method to measure the deflection of the cantilever enables one to measure the probe vibration at any frequency. Since the detection sensitivity of force...

  • Design and construction of a heat stage for investigations of samples by atomic force microscopy above ambient temperatures. Baekmark, Thomas Rosleff; Bjornholm, Thomas; Mouritsen, Ole G. // Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p140 

    Reports on the design and construction of a heat stage to be used together with a commercially available atomic force microscope for direct heating of sample and cantilever. Instrumentation; Monitoring of the ambient temperature; Atomic resolutions.

  • Calibration of atomic-force microscope tips. Hutter, Jeffrey L.; Bechhoefer, John // Review of Scientific Instruments;Jul1993, Vol. 64 Issue 7, p1868 

    Images and force measurements taken by an atomic-force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample's surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality...

  • Low-cost modification of a contact atomic force microscope (AFM) into a sound-activated tapping... Vinckier, Anja; Hennau, Frans; Kjoller, Kevin; Hellemans, Louis // Review of Scientific Instruments;Feb1996, Vol. 67 Issue 2, p387 

    Presents a low-cost implementation of tapping mode atomic force microscope (AFM) on a commercial instrument. Tapping mode AFM in air; Tapping mode AFM in liquid.

  • Scanned-cantilever atomic force microscope. Baselt, David R.; Baldeschwieler, John D. // Review of Scientific Instruments;Apr93, Vol. 64 Issue 4, p908 

    We have developed a 3.6 μm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds...

  • Calibration of optical lever sensitivity for atomic force microscopy. D'Costa, Neill P.; Hoh, Jan H. // Review of Scientific Instruments;Oct95, Vol. 66 Issue 10, p5096 

    Investigates the calibration of optical lever sensitivity for atomic force microscopy. Limiting factor in making measurements; Effects of a fixed displacement of the photodiode detector; Method for optical lever sensitivity calibration; Differences in the shape of the laser spot on the photodiode.

  • Cell biology smorgasbord.  // Nature;12/10/1998, Vol. 396 Issue 6711, p599 

    Presents information on several equipments used for research. Information offered by the BioSupplyNet online service of the SciQuest; Target research of the bioscope atomic-force microscope (AFM) from Digital Instruments; Features of the FlowTACS, an apoptosis detection kit from Genzyme Diagnostics.

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics