High-sensitivity dielectric polarization noise measurements

Israeloff, N.E.; Xiangzhou Wang
March 1997
Review of Scientific Instruments;Mar97, Vol. 68 Issue 3, p1543
Academic Journal
Describes techniques for measurement of low-level dielectric polarization noise spectra over a broad dynamic range. Near-equilibrium dynamics in nonconducting materials; Voltage fluctuations in a capacitance cell filled with sample material; Limitation of effects of stray capacitance; Operation of an ultralow-noise junction field-effect transistor based preamplifier.


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