TITLE

Surface modifications with a scanning force microscope

AUTHOR(S)
Tegen, S.; Kracke, B.; Damaschke, B.
PUB. DATE
March 1997
SOURCE
Review of Scientific Instruments;Mar97, Vol. 68 Issue 3, p1458
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Investigates the possibilities for the use of a scanning force microscope as a machining tool for the modification of gold surfaces. Construction of a scanning force microscope for the creation of structures with constant load and with a force modulation technique; Characterization of structures like lines and circles in thin gold films on mica; Applications of the force modulation technique.
ACCESSION #
4320524

 

Related Articles

  • Dynamics of gold cluster systems. Berlinger, A. // Applied Physics A: Materials Science & Processing;1999, Vol. 68 Issue 4, p403 

    Abstract. The growth of gold clusters on the surface of 10-nm-thick gold films deposited on the isotropic native SiO[sub x] surface of Si(111) wafers was studied as a function of annealing time at relatively low annealing temperatures (50 and 100 Celsius) by application of scanning force...

  • The influence of lateral forces in scanning force microscopy. den Boef, A. J. // Review of Scientific Instruments;Jan1991, Vol. 62 Issue 1, p88 

    A scanning force microscope using interferometric detection of the cantilever deflection is described. The interferometer uses a multimode laser diode with a short coherence length. Despite the poor coherence of the laser, shot-noise-limited detection of displacements is possible, provided that...

  • Polarization modulation laser scanning microscopy: A powerful tool to image molecular orientation and order. Gupta, Vinay K.; Kornfield, Julia A. // Review of Scientific Instruments;Sep94, Vol. 65 Issue 9, p2823 

    To image the orientationaI order in a broad class of biological and manufactured materials, a new microscope has been developed that integrates laser scanning microscopy with polarization modulation polarimetry. Polarimetry allows quantitative characterization of the molecular orientation and...

  • A double-focus lens interferometer for scanning force microscopy. Goto, Kazuya; Sasaki, Minoru; Okuma, Shigeru; Hane, Kazuhiro // Review of Scientific Instruments;May95, Vol. 66 Issue 5, p3182 

    Presents an optical displacement interferometer for scanning force microscopy with a double-focus lens. Optical design of the instrument; Common path and interference signal shared by two interfering beams; Measurement of the noise level of the interferometer.

  • Application of scanning force microscopy in nanotube science. Muster, J.; Duesberg, G.S.; Roth, S.; Burghard, M. // Applied Physics A: Materials Science & Processing;1999, Vol. 69 Issue 3, p261 

    Abstract. Recent developments in the application of scanning force microscopy in nanotube science are reviewed. The non-destructive character of this technique allows the structural characterisation of (chemically modified) single- and multi-wall nanotubes deposited on substrates for further...

  • Nanometer-scale modification of the tribological properties of Si(100) by scanning force microscope. Teuschier, T.; Mahr, K. // Applied Physics Letters;5/8/1995, Vol. 66 Issue 19, p2499 

    Examines hydrogen-terminated Si(100) surface-modification on the nanometer scale using a conducting-probe scanning force microscope (SFM). Description of voltage distribution patterns; Procedures for SFM-lithography performance; Measurements of friction force and height of oxide protrusion...

  • Topographic and electronic studies of wedge-shape surface defects on AlGaAs/GaAs films grown on.. Xu, Q.; Hsu, J. W. P. // Applied Physics Letters;10/4/1999, Vol. 75 Issue 14, p2111 

    Studies the topographic changes and surface contact potential variations near defects on the surface of double heterojunction structures grown on germanium substrates using scanning force microscope and electrostatic force microscope. Direct relation of surface defects to stacking faults...

  • Stress-induced suppression of piezoelectric properties in PbTiO[sub 3]:La thin films via scanning force microscopy. Kholkin, A. L.; Shvartsman, V. V.; Emelyanov, A. Yu.; Poyato, R.; Calzada, M. L.; Pardo, L. // Applied Physics Letters;3/31/2003, Vol. 82 Issue 13, p2127 

    Sol-gel derived polycrystalline La-doped PbTiO[SUB3] films are investigated by scanning force microscopy (SFM) in a piezoelectric contact mode. The SFM signal proportional to the effective piezoelectric coefficient, d[SUBeff], is measured inside individual domains as a function of the mechanical...

  • A scanning force microscope designed for fluid cell measurements. Wigren, Roger; Olsson, Lars; Erlandsson, Ragnar // Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4201 

    Presents a scanning force microscope working in the repulsive force mode designed for fluid-cell measurements and tip-sample interaction studies. Instrument's use of the optical beam deflection principle; Measurement of cantilever motion; Compatibility with commercially available...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics