TITLE

Toward a near-field optical array

AUTHOR(S)
Pantano, Paul; Walt, David R.
PUB. DATE
March 1997
SOURCE
Review of Scientific Instruments;Mar97, Vol. 68 Issue 3, p1357
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents the fabrication and characterization of three near-field optical array types. Chemical etching of a coherent fiber-optic bundle to produce an array of nanometer-sized, optical fiber tips; Variable nanoarchitectures that should be amenable to a large number of near-field scanning optical microscopies.
ACCESSION #
4320504

 

Related Articles

  • Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy. Huntington, S.T.; Nugent, K.A. // Journal of Applied Physics;7/15/1997, Vol. 82 Issue 2, p510 

    Reports that scanning near-field optical microscopy is used to measure the mode profile and evanescent field of a Ge-doped D-shaped optical fiber. Structure of the fiber as determined by differential etching and investigation of the resultant topography with an atomic force microscope;...

  • Infrared-lit needle senses crystal vibrations. Brinkmann, Uwe // Laser Focus World;Nov2002, Vol. 38 Issue 11, p32 

    Focuses on the construction of an optical image of a surface by near-field scanning optical microscope (NSOM). Guidance of light via a fiber tip; Development of an infrared NSOM based on an antenna-type tip that senses chemical compositions; Use of the instrument to obtain resonance with...

  • Increasing shear force microscopy scanning rate using active quality-factor control. Antognozzi, M.; Szczelkun, M. D.; Humphris, A. D. L.; Miles, M. J. // Applied Physics Letters;4/28/2003, Vol. 82 Issue 17, p2761 

    The use of an active quality-factor control device has been demonstrated to increase the scanning rate of a shear force microscope by lowering the quality factor of the oscillating probe. Shear force microscopy )often used in combination with scanning near-field optical microscopy) requires slow...

  • Scanning near-field optical microscopy with aperture probes: Fundamentals and applications. Hecht, Bert; Sick, Beate; Wild, Urs P.; Deckert, Volker; Zenobi, Renato; Martin, Olivier J. F.; Martin, Olivier J.F.; Pohl, Dieter W. // Journal of Chemical Physics;5/8/2000, Vol. 112 Issue 18 

    In this review we describe fundamentals of scanning near-field optical microscopy with aperture probes. After the discussion of instrumentation and probe fabrication, aspects of light propagation in metal-coated, tapered optical fibers are considered. This includes transmission properties and...

  • Video rate near-field scanning optical microscopy. Bukofsky, S.J.; Grober, R.D. // Applied Physics Letters;11/10/1997, Vol. 71 Issue 19, p2749 

    Examines the use of optical fiber probes for increasing the speed of near-field scanning optical microscopes (NSOM). Role of the system bandwidth increase in providing sub-diffraction limit imaging of samples; Use of NSOM as a viable tool for video rate imaging; Relevance of the optical signal...

  • Measurement of an elliptical fiber mode field using near-field microscopy. Butler, D. J.; Horsfall, A.; Nugent, K. A.; Roberts, A.; Bassett, I. M.; Lo, K. M. // Journal of Applied Physics;6/1/1995, Vol. 77 Issue 11, p5514 

    Presents a study which determined the field structure within a non circularly symmetric optical fiber using near-field scanning optical microscopy. Application of the polarization maintaining fibers for photonics systems; Model used for the optical fiber; Overview of the measured field...

  • Characterization of optical fibers using near-field scanning optical microscopy. Butler, D. J.; Nugent, K. A.; Roberts, A. // Journal of Applied Physics;3/15/1994, Vol. 75 Issue 6, p2753 

    Provides information on a study which described a method of determining the field distribution within an optical fiber of arbitrary refractive index profile using near-field scanning optical microscopy. Properties of optical fibers; Experiment; Results and discussion; Conclusion.

  • Novel scanning near-field optical microscope (SNOM)/scanning confocal optical microscope based on... Wolf, J.F.; Hillner, P.E.; Bilewicz, R.; Kolsch, P.; Rabe, J.P. // Review of Scientific Instruments;Jun99, Vol. 70 Issue 6, p2751 

    Reports on a combination of a novel scanning near-field optical microscope/scanning confocal optical microscope based on normal force distance regulation with bent etched fiber tips. Scanner design; Tip production; First results.

  • Shear force scanning near-field optical microscope based on a piezoelectric bimorph cantilever. Shang, G. Y.; Wang, C.; Wu, J.; Bai, C. L.; Lei, F. H. // Review of Scientific Instruments;May2001, Vol. 72 Issue 5, p2344 

    In this article we present a simple, nonoptical shear force detection scheme to control probe-sample distance for a scanning near-field optical microscope (SNOM). Shear force detection is realized by attaching a tapered optical fiber probe to a piezoelectric bimorph cantilever in which one piezo...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics