Surface permeameter for nondestructive measurement of the rf complex permeability spectra of thin

Grimes, Craig A.
December 1996
Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4311
Academic Journal
Focuses on a permeameter designed to measure the complex permeability of films placed adjacent to a measurement device fixture. Applications that require knowledge of the complex permeability of a coating or film applied to a finished, large product; Measurement of the radio frequency (RF) complex permeability spectra of continuous films or coatings.


Related Articles

  • An evaluation of permeability for striped thin films in the gigahertz range. Yabukami, S.; Takezawa, M.; Uo, T.; Yamaguchi, M.; Arai, K. I.; Miyazawa, Y.; Watanabe, M.; Itagaki, A.; Ando, H. // Journal of Applied Physics;5/1/2000, Vol. 87 Issue 9, p5998 

    We developed the fully automatic permeameter which is made of driving plates and shielded loop coil available in 1 MHz–3GHz. We clarified the sensitivity of the permeameter and the sensitivity can be explained by an uncertainty of network analyzer. We evaluate the permeability of striped...

  • A coplanar waveguide permeameter for studying high-frequency properties of soft magnetic materials. Ding, Y.; Klemmer, T. J.; Crawford, T. M. // Journal of Applied Physics;9/1/2004, Vol. 96 Issue 5, p2969 

    The high-frequency relative permeability of thin permalloy films was measured in the frequency and time domain using a microwave coplanar waveguide (CPW). Frequency domain measurements using a loop permeameter were performed for comparison. The Fourier transform of the time domain measurement,...

  • A falling head permeameter for the measurement of the hydraulic conductivity of granular solids. Wilson, M. A.; Wilson, M.A.; Hoff, W. D.; Hoff, W.D.; Brown, R. J. E.; Brown, R.J.E.; Carter, M. A.; Carter, M.A. // Review of Scientific Instruments;Oct2000, Vol. 71 Issue 10 

    A falling head permeameter is described in which pairs of infrared emitters and detectors on a sight tube are used to measure the flow rate associated with the passage of water through a granular solid under the action of a diminishing pressure head. An equation relating pressure head to elapsed...

  • CREASED-PLASTIC ROCK PARAMETER FOR HYDROGEOLOGY STUDENTS. Hudak, Paul F. // Journal of Geoscience Education;Mar2001, Vol. 49 Issue 2, p182 

    Deals with a study which discussed the design of an inexpensive rock permeameter for an introductory hydrogeology college course. Methodology; Application of the permeameter; Test results of the crease-plastic permeameter; Limitations of gas permeameters and creased-plastic permeameters.

  • Cathodoluminescence studies of the deep level emission bands of AlxGa1-xN films deposited on 6H-... Perry, William G.; Bremser, M.B.; Davis, R. F. // Journal of Applied Physics;1/1/1998, Vol. 83 Issue 1, p469 

    Studies the sub band edge emission bands of Alx Ga1-xN (0.06

  • Laser-induced chemical vapor deposition of nanostructured silicon carbonitride thin films. Besling, W.F.A.; Goossens, A.; Meester, B.; Schoonman, J. // Journal of Applied Physics;1/1/1998, Vol. 83 Issue 1, p544 

    Analyzes the laser induced chemical vapor deposition of nanostructured silicon carbonitride thin films. Description of gas phase deposition reactions induced by a CO2 laser in parallel configuration with the substrate; Experimental procedure used; Results of the findings.

  • Kinetics of Cu3Ge formation and reaction with Al. Huang, J.S.; Huang, S.S. // Journal of Applied Physics;7/15/1997, Vol. 82 Issue 2, p644 

    Reports that Cu3Ge films have low resistivity, good adhesion on SiO2, good thermal stability on Si, and good oxidation resistance. Reaction in bilayers of Cu/Ge films; Reaction in Cu films on Ge wafers; Stability of Cu3Ge against Al in bilayers of Al/Cu3Ge films.

  • Properties of chemically deposited Cu2S films on porous silicon. Dhar, S.; Chakrabarti, S. // Journal of Applied Physics;7/15/1997, Vol. 82 Issue 2, p655 

    Studies the electrical and optical properties of Cu2S films deposited on porous Si from a chemical bath. Annealing of deposited film in air as important in obtaining films with the lowest values of electrical resistivities.

  • Two layer model for photothermal radiometry applied on semiconducting thin films. Nestoros, M.; Karmiotis, Y. // Journal of Applied Physics;12/15/1997, Vol. 82 Issue 12, p6220 

    Studies a two layer model for photothermal radiometry applied on semiconducting thin films. Defintion on the Photothermal radiometry (PTR); Comparison of the PTR signal resulting from a heavily implanted wafer and a nonimplanted crystalline one; Results of the study.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics