Dielectric Fabry-Perot interferometer for temperature dependent far-infrared reflectivity

Kohnen, T.; Koning, J.J.; Burghoorn, J.; Wyder, P.
December 1996
Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4304
Academic Journal
Develops a far-infrared reflectivity set up for spectroscopy on highly reflective materials in a resistive Bitter magnet. Use of a silicon reflection Fabry-Perot interferometer as a multiple reflection device; Changes in reflectivity as a function of magnetic field; Absolute value of reflectivity obtained; Extension of excitation to lower energies.


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