Inexpensive circuit for the measurement of capture cross section of deep level defects in

Reddy, C.V.; Fung, S.; Beling, C.D.
December 1996
Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4279
Academic Journal
Describes a simple and inexpensive circuit to facilitate the direct measurement of capture cross section, when synchronized with a deep level transient spectroscopy system. Connection and disconnection of the capacitance meter from the apparatus with the help of reed relay switches; Application of sharp bias pulses with no observable distortion.


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