A scanning force microscope designed for fluid cell measurements

Wigren, Roger; Olsson, Lars; Erlandsson, Ragnar
December 1996
Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4201
Academic Journal
Presents a scanning force microscope working in the repulsive force mode designed for fluid-cell measurements and tip-sample interaction studies. Instrument's use of the optical beam deflection principle; Measurement of cantilever motion; Compatibility with commercially available microfabricated cantilevers; Accommodation of tube scanners with various lengths.


Related Articles

  • The influence of lateral forces in scanning force microscopy. den Boef, A. J. // Review of Scientific Instruments;Jan1991, Vol. 62 Issue 1, p88 

    A scanning force microscope using interferometric detection of the cantilever deflection is described. The interferometer uses a multimode laser diode with a short coherence length. Despite the poor coherence of the laser, shot-noise-limited detection of displacements is possible, provided that...

  • Polarization modulation laser scanning microscopy: A powerful tool to image molecular orientation and order. Gupta, Vinay K.; Kornfield, Julia A. // Review of Scientific Instruments;Sep94, Vol. 65 Issue 9, p2823 

    To image the orientationaI order in a broad class of biological and manufactured materials, a new microscope has been developed that integrates laser scanning microscopy with polarization modulation polarimetry. Polarimetry allows quantitative characterization of the molecular orientation and...

  • A double-focus lens interferometer for scanning force microscopy. Goto, Kazuya; Sasaki, Minoru; Okuma, Shigeru; Hane, Kazuhiro // Review of Scientific Instruments;May95, Vol. 66 Issue 5, p3182 

    Presents an optical displacement interferometer for scanning force microscopy with a double-focus lens. Optical design of the instrument; Common path and interference signal shared by two interfering beams; Measurement of the noise level of the interferometer.

  • Application of scanning force microscopy in nanotube science. Muster, J.; Duesberg, G.S.; Roth, S.; Burghard, M. // Applied Physics A: Materials Science & Processing;1999, Vol. 69 Issue 3, p261 

    Abstract. Recent developments in the application of scanning force microscopy in nanotube science are reviewed. The non-destructive character of this technique allows the structural characterisation of (chemically modified) single- and multi-wall nanotubes deposited on substrates for further...

  • Attractive mode force microscopy using a feedback-controlled fiber interferometer. Nonnenmacher, M.; Vaez-Iravani, M.; Wickramasinghe, H. K. // Review of Scientific Instruments;Nov92, Vol. 63 Issue 11, p5373 

    We present a force microscope which uses a feedback-controlled differential fiber interferometer for the measurement of the deflection of the force-sensing cantilever. Due to the differential principle, and the feedback control, the influence of thermal and mechanical drifts or fluctuations is...

  • Dynamic scanning force microscopy study of self-assembled DNA-protein nanostructures. Pignataro, B.; L. Chi; S. Gao; Anczykowski, B.; Niemeyer, C.; Adler, M.; Fuchs, H. // Applied Physics A: Materials Science & Processing;2002, Vol. 74 Issue 3, p447 

    Self-assembled oligomeric nanostructures consisting of bisbiotinylated DNA fragments connected by the protein streptavidin (STV) are studied by dynamic scanning force microscopy (SFM) operating in air. A comparison of the images taken in repulsive and attractive regimes is systematically ...

  • Phase-locked noncontact scanning force microscope. Kikukawa, Atsushi; Hosaka, Sumio; Honda, Yukio; Imura, Ryo // Review of Scientific Instruments;Jan1995, Vol. 66 Issue 1, p101 

    Proposes a new tip height control system for noncontact scanning force microscope (SFM) utilizing the phase-lock technology. Stability of the system; Proximity of the tip to the sample surface; Use of an oscillator with cantilever as a mechanical resonator to become voltage controlled...

  • Microscale to nanoscale ferroelectric domain and surface engineering of a near-stoichiometric LiNbO[sub 3] crystal. Terabe, Kazuya; Nakamura, Masaru; Takekawa, Shunji; Kitamura, Kenji; Higuchi, Shinji; Gotoh, Yoshihiko; Cho, Yasuo // Applied Physics Letters;1/20/2003, Vol. 82 Issue 3, p433 

    We have investigated microscale to nanoscale ferroelectric domain and surface engineering of a near-stoichiometric LiNbO[SUB3] crystal by using scanning force microscopy. The single crystals LiNbO[SUB3] fixed on metal substrates were polished to a 5 μm thickness. Artificial patterns of...

  • Stress-induced suppression of piezoelectric properties in PbTiO[sub 3]:La thin films via scanning force microscopy. Kholkin, A. L.; Shvartsman, V. V.; Emelyanov, A. Yu.; Poyato, R.; Calzada, M. L.; Pardo, L. // Applied Physics Letters;3/31/2003, Vol. 82 Issue 13, p2127 

    Sol-gel derived polycrystalline La-doped PbTiO[SUB3] films are investigated by scanning force microscopy (SFM) in a piezoelectric contact mode. The SFM signal proportional to the effective piezoelectric coefficient, d[SUBeff], is measured inside individual domains as a function of the mechanical...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics