TITLE

Improvements to atomic force microscopy cantilevers for increased stability

AUTHOR(S)
Wenzler, L.A.; Moyes, G.L.; Beebe Jr., T.P.
PUB. DATE
December 1996
SOURCE
Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4191
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Describes a modification of commercially manufactured atomic force microscopy cantilevers which reduces the bending of the V-shaped legs due to changes in temperature. Stress-related effects that might be responsible for the observed bending; Retention of the required optical reflectivity for the laser deflection system; Changes in the detector photodiode signal related to bending.
ACCESSION #
4320465

 

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