Improvements to atomic force microscopy cantilevers for increased stability

Wenzler, L.A.; Moyes, G.L.; Beebe Jr., T.P.
December 1996
Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4191
Academic Journal
Describes a modification of commercially manufactured atomic force microscopy cantilevers which reduces the bending of the V-shaped legs due to changes in temperature. Stress-related effects that might be responsible for the observed bending; Retention of the required optical reflectivity for the laser deflection system; Changes in the detector photodiode signal related to bending.


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