TITLE

In situ grazing incidence x-ray diffraction system for clusters deposited on a low-temperature

AUTHOR(S)
Koga, Kenji; Takeo, Harutoshi
PUB. DATE
December 1996
SOURCE
Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4092
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Focuses on a grazing-incidence x-ray diffraction (GIXRD) system combined with cluster formation and deposition chambers. Study of structures of clusters deposited on a low-temperature substrate; Coalescence growth among deposited clusters at room temperature; How low-temperature cluster deposition does not destroy the characteristic structure of free clusters.
ACCESSION #
4320446

 

Related Articles

  • The determination of phases formed in AISiCu/Tin/Ti contact metallization structure of integrated... Fortin, V.; Gagnon, G.; Caron, M.; Gujrathi, S. C.; Currie, J. F.; Ouellet, L.; Tremblay, Y.; Biberger, M. // Journal of Applied Physics;1/1/1998, Vol. 83 Issue 1, p132 

    Presents a study which eamines x-ray diffraction (XRD) results that will be useful to understand and explain the main effects on the TiN barrier integrity due to the annealing temperature, the air exposure, the ARC layer, the TiN thickness and the substrate. Formation of phases at Al alloy TiN...

  • X-ray diffraction study of intentionally disordered (GaIn)As/Ga(PAs) heterostructures. Rettig, R.; Marschner, T.; Stolz, W.; Tapfer, L. // Journal of Applied Physics;7/1/1998, Vol. 84 Issue 1, p237 

    Provides information on a study investigating the influence of layer thickness fluctuations and deviation from perfect periodicity on high resolution x-ray diffraction (HR XRD) profiles. Methodology used to conduct the study; Information double side grading; Findings of the study.

  • Simulation of the Stepped Surface of a High-Resolution X-ray Diffractor. Mazuritsky, M. I.; Latush, E. M.; Soldatov, A. V.; Ugol´┐Żnitskii, G. A.; Lyashenko, V. L.; Marcelli, A. // Technical Physics Letters;Jun2000, Vol. 26 Issue 6, p502 

    Three possible schemes of a high-resolution stepped X-ray diffractor have been analyzed, including those based on the steps of equal angular widths, the steps of equal heights (i.e., distances from the step edge to the beginning of the next step), and the symmetric steps (where a distance from...

  • A Focusing X-ray Diffractor: Effect of the Crystal Bending Parameters on the Spectral Resolution. Latush, E. M.; Mazuritsky, M. I. // Technical Physics Letters;Feb2002, Vol. 28 Issue 2, p142 

    The dependence of the spectral resolution of a focusing X-ray diffractor on the shape and curvature of the reflecting crystallographic faces in the plane perpendicular to the focusing circle plane is theoretically studied in the point source approximation. The curvature parameters ensuring the...

  • High resolution imaging of electronic devices via x-ray diffraction topography. Beard, W. T.; Green, K. A.; Zhang, X.-J.; Armstrong, R. W. // Applied Physics Letters;7/22/1996, Vol. 69 Issue 4, p488 

    Measurements are reported for x-ray diffraction topography (XRDT) images of implantation and superstructure details in an integrated circuit device investigated with the reflection method of line modified-asymmetric crystal topography (LM-ACT). The x-ray penetration depth and the micron grain...

  • Characterization of excimer laser annealed polycrystalline Si1-xGex alloy thin films by x-ray... Yu, Guolin; Krishna, Kalaga Murali; Shao, Chunlin; Umeno, Masayoshi; Soga, Tetsuo; Watanabe, Junji; Jimbo, Takashi // Journal of Applied Physics;1/1/1998, Vol. 83 Issue 1, p174 

    Presents a study on the characterization of excimer laser annealed polycrystalline Si1-xGex alloy thin films by using x-ray diffraction and spectroscopic ellipsometry. What Si1-xGex provides; Experimental procedure used to carry out the study; Discussion and results of the study.

  • THE FIRST SECONDS IN A BUILDING'S LIFE.  // USA Today Magazine;Aug2012, Vol. 141 Issue 2807, p15 

    The article reports on the role of superplasticizers in X-ray diffraction, as indicated in a study published in the journal "Angewandte Chemie" in 2012.

  • An out-of-plane detector for surface x-ray diffraction. Taylor, J.S.G.; Norris, C.; Vlieg, E.; Lohmeier, M.; Turner, T.S. // Review of Scientific Instruments;Jul96, Vol. 67 Issue 7, p2658 

    Presents an out-of-plane detector movement for the detector arm of the surface x-ray diffractometer on the wiggler beam line on the synchrotron radiation source at a laboratory. Increase in the volume of reciprocal space.

  • Improved diamond anvil high-pressure cell for single-crystal work. Koepke, J.; Dieterich, W.; Glinnemann, J.; Schulz, H. // Review of Scientific Instruments;Nov85, Vol. 56 Issue 11, p2119 

    A diamond anvil high-pressure cell especially designed for single-crystal x-ray diffraction studies is described, and with its commercial STOE goniometer head the new cell fits to almost every diffractometer type in use. In this high-pressure cell the x-ray beam passes nearly perpendicular to...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics