Scanning shearing-stress microscope

Sasaki, A.; Katsumata, A.; Iwata, F.; Aoyama, H.
January 1994
Applied Physics Letters;1/3/1994, Vol. 64 Issue 1, p124
Academic Journal
Develops a scanning probe microscope based on a scanning tunneling microscope (STM). Improvement of the frequency shift of an AT cut quartz resonator; Oscillation of the quartz resonator coupled to an STM sample; Changes of subsurface shearing stresses in gold thin films.


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