Transport properties of

Stolzel, C.; Siegel, M.; Adrian, G.; Krimmer, C.; Sollner, J.; Wilkens, W.; Schulz, G.; Adrian, H.
November 1993
Applied Physics Letters;11/22/1993, Vol. 63 Issue 21, p2970
Academic Journal
Examines the transport properties of Josephson junctions with a Y[sub 0.3]Pr[sub 0.7]Ba[sub 2]Cu[sub 3]O[sub 7-delta] as a barrier layer. Preparation of the material using a multistep laser ablation process; Occurrence of current-voltage curves under microwave irradiation; Dependence of critical current on barrier layer thickness.


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