TITLE

Analysis of the electric field induced elemental separation of Ge2Sb2Te5 by transmission electron microscopy

AUTHOR(S)
Dongmin Kang; Dongbok Lee; Hyun-Mi Kim; Sung-Wook Nam; Min-Ho Kwon; Ki-Bum Kim
PUB. DATE
July 2009
SOURCE
Applied Physics Letters;7/6/2009, Vol. 95 Issue 1, p011904
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The chemical instability of line patterned Ge2Sb2Te5 was studied by transmission electron microscopy after electrically inducing melt and solidification. Compositional analysis showed elemental separation of Te to the anode side, while Ge and Sb mutually separated at the cathode side. Such elemental separation of Ge2Sb2Te5 is explained by the electric field effects and thermodynamic driving forces.
ACCESSION #
43158506

 

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