Analysis of the electric field induced elemental separation of Ge2Sb2Te5 by transmission electron microscopy

Dongmin Kang; Dongbok Lee; Hyun-Mi Kim; Sung-Wook Nam; Min-Ho Kwon; Ki-Bum Kim
July 2009
Applied Physics Letters;7/6/2009, Vol. 95 Issue 1, p011904
Academic Journal
The chemical instability of line patterned Ge2Sb2Te5 was studied by transmission electron microscopy after electrically inducing melt and solidification. Compositional analysis showed elemental separation of Te to the anode side, while Ge and Sb mutually separated at the cathode side. Such elemental separation of Ge2Sb2Te5 is explained by the electric field effects and thermodynamic driving forces.


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