TITLE

Vacuum near-field scanning optical microscope for variable cryogenic temperatures

AUTHOR(S)
Behme, G.; Richter, A.; Suptitz, M.; Lienau, Ch.
PUB. DATE
September 1997
SOURCE
Review of Scientific Instruments;Sep97, Vol. 68 Issue 9, p3458
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Describes the design of a novel near-field scanning optical microscope (NSOM) for cyrogenic temperatures and operation in vacuum. Use of a helium flow cryostat for active temperature control of the sample; Simplification of the near-field microscopy at variable sample temperatures; Schematic diagram of the NSOM scan head.
ACCESSION #
4303433

 

Related Articles

  • Glue-free tuning fork shear-force microscope. Mühlschlegel, P.; Toquant, J.; Pohl, D. W.; Hecht, B. // Review of Scientific Instruments;Jan2006, Vol. 77 Issue 1, p016105 

    A scanning near-field optical microscope without any glued parts is described. Key elements are the optical fiber probe/tuning fork junction and the piezotube scanner assembly. In both cases, fixation is achieved by means of controlled pressure and elastic deformation. The avoidance of glued...

  • Scanning Near-field Optical Microscopy (SNOM). Vobornik, Slavenka; Vobornik, Dusan // Acta Informatica Medica;2005, Vol. 13 Issue 3, p161 

    An average human eye can see details down to 0.07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today's science needs eyes for the nano-world. Examples are easily found in biology and medical...

  • Three-dimensional wavefront imaging by near-field scanning optical microscopy. Levy, J.; Cohen, A.; Awschalom, D.D. // Review of Scientific Instruments;May95, Vol. 66 Issue 5, p3385 

    Describes the design of a near-field scanning optical microscope head compatible with an existing commercial scanning probe system. Collection of near-field images of coherent scattering from a fused silica grating; Comparison of the images with numerical simulations of scattering using both...

  • Tip-sample interaction in a `shear-force' near-field scanning optical microscope. Hsu, Kate; Gheber, Levi A. // Review of Scientific Instruments;Sep99, Vol. 70 Issue 9, p3609 

    Analyzes the interaction between the tip of a near-field scanning optical microscope and the sample it scans, and compares it with a simple tapping model. Oscillations pattern of the feedback loop; 'Shear-force control'; Similarity with the tapping mode in atomic force microscope.

  • Influence of the water layer on the shear force damping in near-field microscopy. Davy, S.; Spajer, M.; Courjon, D. // Applied Physics Letters;11/2/1998, Vol. 73 Issue 18 

    The influence of the water layer on the shear force damping is investigated in the case of a perfectly flat mica surface. In ambient conditions it is shown that the damping curve exhibits three particular regimes depending on the tip-sample distance. Moreover, the damping varies significantly...

  • Approach interactions of scanned probes in dynamic pecking mode. Wetsel, G. C.; Farahi, R. H.; Richardson, C. J. K.; Spicer, J. B. // Applied Physics Letters;10/15/2001, Vol. 79 Issue 16, p2657 

    Sharp, conical, metallic tips oriented perpendicular to the axis of a rod vibrating in bending (pecking mode) are used as force sensors in scanned force probes and as optical scatterers in apertureless near-field optical microscopes. We have measured the displacement of such probes as a function...

  • Demonstration of near-field scanning photoreflectance spectroscopy. Paulson, Charles; Ellis, A. B.; Ellis, A.B.; McCaughan, Leon; Hawkins, Brian; Sun, Jingxi; Jingxi Sun; Kuech, T. F.; Kuech, T.F. // Applied Physics Letters;9/25/2000, Vol. 77 Issue 13 

    A near-field scanning optical microscope (NSOM) was developed to perform photoreflectance (PR) spectroscopy experiments at high spatial resolution (∼1 μm). Representative PR spectra are shown, along with an image illustrating the capability of observing contrast in images due to the...

  • Scattering of evanescent light by a finite-size probe in near-field scanning optical microscopy. Fukuzawa, Kenji; Kuwano, Hiroki // Journal of Applied Physics;11/1/1996, Vol. 80 Issue 9, p4799 

    Focuses on a study which calculated the scattering of the evanescent light by a finite-size SiO[sub2] probe in near field scanning optical microscopy. Electromagnetic-field calculation; Results and discussion; Conclusion.

  • Tiny Tips Probe Nanotechnology. Malsch, Ineke // Industrial Physicist;Oct/Nov2002, Vol. 8 Issue 5, p16 

    Examines the scanning probe microscopes for accurate measurements of the nanostructures in three dimensions. Capabilities of the scanning tunneling microscopes on atomic structure imaging; Ability of the scanning near-field optical microscopes on optical images of delicate structures; Level of...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics