Localized sureface elasticity measurements using an atomic force microscope

DeVecchio, Derik; Bhushan, Bharat
December 1997
Review of Scientific Instruments;Dec1997, Vol. 68 Issue 12, p4498
Academic Journal
Investigates localized surface elasticity measurements using an atomic force microscope. Identification and mapping of the differences in the stiffness of elasticity of ultrathin films; Provision of an alternative to current elasticity measurements; Application of the technique to quantitatively measure the elasticity of polytetrafluoroethylene.


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