TITLE

Localized sureface elasticity measurements using an atomic force microscope

AUTHOR(S)
DeVecchio, Derik; Bhushan, Bharat
PUB. DATE
December 1997
SOURCE
Review of Scientific Instruments;Dec1997, Vol. 68 Issue 12, p4498
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Investigates localized surface elasticity measurements using an atomic force microscope. Identification and mapping of the differences in the stiffness of elasticity of ultrathin films; Provision of an alternative to current elasticity measurements; Application of the technique to quantitatively measure the elasticity of polytetrafluoroethylene.
ACCESSION #
4302392

 

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