Floating electrometer for scanning tunneling microscope applications in the femtoampere range

Heer, R.; Eder, C.; Smoliner, J.; Gornik, E.
December 1997
Review of Scientific Instruments;Dec1997, Vol. 68 Issue 12, p4488
Academic Journal
Describes a high precision current-voltage converter applicable to scanning tunneling microscopy (STM) and ballistic electron emission microscopy (BEEM) measurements. Characteristics of the electrometer circuit; Usefulness of the amplifier for any floating applications; Speed of the circuit.


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