Calibration of optical lever sensitivity for atomic force microscopy

D'Costa, Neill P.; Hoh, Jan H.
October 1995
Review of Scientific Instruments;Oct95, Vol. 66 Issue 10, p5096
Academic Journal
Investigates the calibration of optical lever sensitivity for atomic force microscopy. Limiting factor in making measurements; Effects of a fixed displacement of the photodiode detector; Method for optical lever sensitivity calibration; Differences in the shape of the laser spot on the photodiode.


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