TITLE

Electronic structure characterization of La2NiMnO6 epitaxial thin films using synchrotron-radiation photoelectron spectroscopy and optical spectroscopy

AUTHOR(S)
Kitamura, M.; Ohkubo, I.; Matsunami, M.; Horiba, K.; Kumigashira, H.; Matsumoto, Y.; Koinuma, H.; Oshima, M.
PUB. DATE
June 2009
SOURCE
Applied Physics Letters;6/29/2009, Vol. 94 Issue 26, p262503
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Electronic structures of La2NiMnO6 epitaxial films are characterized using synchrotron-radiation photoelectron spectroscopy and optical spectroscopy. X-ray absorption spectra reveal that the valence states of Ni2+ and Mn4+ are dominant. The electronic structure at the valence band maximum is mainly derived from the Mn 3d state. The conduction band minimum is composed mostly of the Mn 3d-O 2p hybridized state. The optical gap is estimated to be about 1.5 eV based on the optical conductivity derived from optical spectra.
ACCESSION #
42961954

 

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