A passive long-wavelength infrared microscope with a highly sensitive phototransistor

Kajihara, Yusuke; Komiyama, Susumu; Nickels, Patrick; Ueda, Takeji
June 2009
Review of Scientific Instruments;Jun2009, Vol. 80 Issue 6, p063702
Academic Journal
A passive scanning confocal microscope in the long-wavelength infrared (LWIR) region has been developed for sensitive imaging of spontaneous LWIR radiation by utilizing an ultrahighly sensitive detector, called the charge-sensitive infrared phototransistor (CSIP). The microscope consisted of room-temperature components including a Ge objective lens and liquid helium temperature components including a confocal pinhole, Ge relay lenses, and CSIP detector. With the microscope, thermal radiation (wavelength of 14.7 μm) spontaneously emitted by the object was studied with a spatial resolution of 25 μm. Clear passive LWIR imaging pictures were obtained by scanning a sample consisting of glass, Al foil, Ag paste, and Au. Clear passive LWIR image was also obtained even when the sample surface was covered by a GaAs or Si plate. This work suggests usefulness of CSIP detectors for application of passive LWIR microscopy.


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