TITLE

Setup for in situ x-ray diffraction and ion-channeling studies of

AUTHOR(S)
Grigull, S.; Foltyn, S.; Hollander, M.G.; Evans, C.R.; Nastasi, M.
PUB. DATE
September 1999
SOURCE
Review of Scientific Instruments;Sep99, Vol. 70 Issue 9, p3656
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Introduces a novel setup that combines energy-dispersive x-ray diffraction and ion-channeling capabilities for damage studies on single-crystalline thin films irradiated with 100-720 keV heavy ions. Measurement of damage-related lattice strain; Provision of information on bombardment-induced disorder complementary to the channeling technique.
ACCESSION #
4295852

 

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