Short cantilevers for atomic force microscopy

Walters, D.A.; Cleveland, J.P.
October 1996
Review of Scientific Instruments;Oct96, Vol. 67 Issue 10, p3583
Academic Journal
Evaluates a family of silicon nitride cantilevers for atomic force microscopy. Measurement of the frequency spectrum of thermal motion in air and water; Effective cantilever density; Advantages of the high resonant frequency and low noise of a short cantilever.


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