TITLE

Short cantilevers for atomic force microscopy

AUTHOR(S)
Walters, D.A.; Cleveland, J.P.
PUB. DATE
October 1996
SOURCE
Review of Scientific Instruments;Oct96, Vol. 67 Issue 10, p3583
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Evaluates a family of silicon nitride cantilevers for atomic force microscopy. Measurement of the frequency spectrum of thermal motion in air and water; Effective cantilever density; Advantages of the high resonant frequency and low noise of a short cantilever.
ACCESSION #
4295502

 

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