TITLE

A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope

AUTHOR(S)
Lieberman, Klony; Ben-Ami, Nily; Lewis, Aaron
PUB. DATE
October 1996
SOURCE
Review of Scientific Instruments;Oct96, Vol. 67 Issue 10, p3567
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents a near-field scanning optical microscope (NSOM) which fully integrates near-field and far-filed optics with scanned probe microscopy (SPM). Incorporation of a novel, flat scanning system; Utilization of cantilevered optical force sensing probes; Normal force sensing capability of probes and microscope.
ACCESSION #
4295499

 

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