Technique for the removal of electrons from an extracted, pulsed, H[sup -] ion beam

Perkins, Luke T.; Herz, P.R.; Leung, K.N.; Pickard, D.S.
October 1996
Review of Scientific Instruments;Oct96, Vol. 67 Issue 10, p3497
Academic Journal
Reports on a permanent-magnet insert structure for the removal of electrons from an extracted, pulsed negative ion beams developed at Lawrence Berkeley National Laboratory. Extraction field strength of the device; Percentage of electrons removed by the device from extracted negative ion beam; Orientation of the magnetic collar with respect to the filter rods.


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