Mean secondary electron yield of avalance electrons in the channels of a microchannel plate

Funsten, H.O.; Suszcynsky, D.M.
October 1996
Review of Scientific Instruments;Oct96, Vol. 67 Issue 10, p3478
Academic Journal
Studies the mean secondary electron yield of avalanche electrons in the channels of a microchannel plate (MCP) detector. Avalanche initiation by particle impact on a channel wall; Avalanche initiation by particle impact on the web; Secondary electron yield derived from studies using measurements of the MCP gain.


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