TITLE

NEW INSTRUMENTS

AUTHOR(S)
Stern, Joshua
PUB. DATE
June 1996
SOURCE
Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2421
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents scientific instruments for various purposes and applications. Electron microscopes; Impact testers; Vibration-isolation workstations; Nitrogen generation systems.
ACCESSION #
4295465

 

Related Articles

  • Pulsed mirror electron microscope: A fast near-surface imaging probe. Kleinschmidt, H.; Bostanjoglo, O. // Review of Scientific Instruments;Oct2001, Vol. 72 Issue 10, p3898 

    A pulsed mirror electron microscope was developed for imaging laser-induced processes on the nanosecond time scale. Variations of the electronic structure of the surface are imaged. The evaporation or deposition of an atomic monolayer is readily detected. Pulsed mirror electron microscopy is an...

  • Parallel detection for high-resolution electron energy loss studies in the scanning transmission electron microscope. Batson, P. E. // Review of Scientific Instruments;Jul1988, Vol. 59 Issue 7, p1132 

    A parallel detection system has been added to the Wien Filter electron spectrometer on the dedicated scanning transmission electron microscope at IBM. The system uses an intensified diode array that is optically coupled to a single-crystal YAG screen by a vacuum window and an f/1.4–22...

  • A reflection electron microscope for imaging of fast phase transitions on surfaces. Bostanjoglo, O.; Heinricht, F. // Review of Scientific Instruments;Apr90, Vol. 61 Issue 4, p1223 

    A reflection electron microscope for ultrashort-time imaging of laser-induced processes on surfaces was developed. The instrument is based on a conventional transmission electron microscope modified for high-energy electron reflection, and, in addition, equipped with a laser-pulsed...

  • A high-resolution mixed field immersion lens attachment for conventional scanning electron microscopes. Khursheed, A.; Karuppiah, N. // Review of Scientific Instruments;Aug2002, Vol. 73 Issue 8, p2906 

    This article deals with a compact mixed field add-on lens attachment for conventional scanning electron microscopes (SEMs). By immersing the specimen in a mixed electric-magnetic field combination, the add-on lens is able to provide high image resolution at relatively low landing energies (< 1...

  • Examining deep holes by rocking the beam in the scanning electron microscope. Wells, Oliver C. // Review of Scientific Instruments;Apr96, Vol. 67 Issue 4, p1458 

    Examines deep holes by rocking the beam in the scanning electron microscope. Description of the beam rocking (BR) method; Spherical aberration of the final lens; Internal and external BR methods.

  • Combined ultrahigh vacuum scanning tunneling microscope scanning electron microscope system. Memmert, U.; Hodel, U.; Hartmann, U. // Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2269 

    Describes a combined ultrahigh vacuum scanning microscope (STM)-scanning electron microscope (SEM) system. Feature of atomic resolution on semiconductor surfaces by the STM; Atomic resolution imaging of silicon surfaces to check STM performance; Potential of the system for high-resolution...

  • An atomic oxygen environmental cell for a transmission electron microscope. Rodriguez, N. M.; Oh, S. G.; Downs, W. B.; Pattabiraman, P.; Baker, R. T. K. // Review of Scientific Instruments;Jul1990, Vol. 61 Issue 7, p1863 

    The capabilities of the transmission electron microscope have been extended to enable in situ studies of the interaction of atomic oxygen with various solids to be performed. This has been accomplished by modifying the specimen chamber region of a JEOL 200CX TEM/STEM electron microscope to...

  • A topography measurement instrument based on the scanning electron microscope. Thong, J. T. L.; Breton, B.C. // Review of Scientific Instruments;Jan1992, Vol. 63 Issue 1, p131 

    A technique for in situ measurement of surface height variations in the scanning electron microscope (SEM) has been developed. Based on the comparison of images of microscopic areas obtained by tilting the electron beam, cross correlation is used to determine the image shift between like...

  • Magnetic field calibration of a transmission electron microscope using a permanent magnet material. Volkov, V. V.; Crew, D. C.; Zhu, Y.; Lewis, L. H. // Review of Scientific Instruments;Jun2002, Vol. 73 Issue 6, p2298 

    A new method of assessing the magnitude of the magnetic field in a transmission electron microscope using a permanent magnetic material is described. The approach is versatile and simple enough to be implemented for certain scientific or engineering situations in which the exact calibration of...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics