TITLE

Determination of recombination parameters in silicon wafers by transient microwave absorption

AUTHOR(S)
Gaubas, E.; Kaniava, A.
PUB. DATE
June 1996
SOURCE
Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2339
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Focuses on principles of measurement of photoconductance transients by time-resolved microwave absorption and reflection mode. Sensitivity of the instrument to microwave response signal; Mapping of recombination parameters in silicon wafers provided by the waveguide slot resonance antenna.
ACCESSION #
4295447

 

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