Determination of recombination parameters in silicon wafers by transient microwave absorption

Gaubas, E.; Kaniava, A.
June 1996
Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2339
Academic Journal
Focuses on principles of measurement of photoconductance transients by time-resolved microwave absorption and reflection mode. Sensitivity of the instrument to microwave response signal; Mapping of recombination parameters in silicon wafers provided by the waveguide slot resonance antenna.


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