Scanning nonlinear dielectric microscope

Cho, Yasuo; Kirihara, Akio; Saeki, Takahiro
June 1996
Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2297
Academic Journal
Describes a scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to-point variation of its nonlinear dielectric constants. Theory for detecting polarization; Technique for measuring nonlinear dielectric response; Achievement of area scans of the polarization of poled lead zirconate titanate ceramics.


Related Articles

  • SCANNER.  // BioScience;Jun85, Vol. 35 Issue 6, p372 

    Reviews the Ambis Beta Scanning System from Automated Microbiology Systems Inc.

  • A photoacoustic scanning method to determine thermal effusivity of solid samples. Philip, J. // Review of Scientific Instruments;Oct96, Vol. 67 Issue 10, p3621 

    Discusses a photoacoustic scanning method to determine thermal effusivity of solid samples. Changing the backing medium for a highly absorbing sample layer by scanning its surface with an intensity modulated light beam; Overview on the principle and theory of a photoacoustic scanning technique;...

  • Automated, low-temperature dielectric relaxation apparatus for measurement of air-sensitive, corrosive, hygroscopic, powdered samples Bessonette, Paul W. R.; Bessonette, Paul W.R.; White, Mary Anne // Review of Scientific Instruments;Jul99, Vol. 70 Issue 7, p3113 

    Reports on the development of a design for an automated apparatus for dielectric determinations on solid samples. Dielectric data frequency range; Temperature range; Dielectric constant and loss.

  • NEW MATERIALS AND COMPONENTS.  // Review of Scientific Instruments;Mar96, Vol. 67 Issue 3, p858 

    Contains information on the physical properties of several scientific instruments. Vacuum analysis system; Bar code scanner for atomic spectroscopy; Digital temperature control; Ring illuminator for stereo microscopes; VXI plug&play compliant software; Magnetometer.

  • Compensation method based on formularizing hysteresis of piezoelectric tube scanners. Cao Wei; Honghai Zhang; Lu Tao; Wenji Li; Hanmin Shi // Review of Scientific Instruments;Oct96, Vol. 67 Issue 10, p3594 

    Discusses a three-dimensional scanning model of piezoelectric tubes and its used to compensate distortions of measured images scanned by a piezoelectric tube. Omission of the vertical scanning error induced by transverse scanning of the tip; Relations between the three-dimensional scanning...

  • Properties of a differential pressure pseudospark device. Karkari, S. K.; Karkari, S.K.; Mukherjee, S.; John, P. I.; John, P.I. // Review of Scientific Instruments;Jan2000, Vol. 71 Issue 1 

    A differential pressure pseudospark device is developed to produce a discharge at a pressure of 10[sup -4] mbar near the anode. This pressure range is two orders in magnitude lower than conventional pseudospark devices. In this device a pressure gradient is maintained between the cathode and the...

  • Limitations of the terahertz photomixer. Nowak, Kacper; Jarzab, Przemyslaw P.; Plinski, Edward F. // Review of Scientific Instruments;Dec2011, Vol. 82 Issue 12, p123113 

    In the paper, Fourier transform has been used for calculations of a refractive index of dielectric samples measured in the terahertz photomixer arrangement. We considered measurement limitations caused by a sampling frequency and a photomixer bandwidth.

  • Cryogenic scanning Hall-probe microscope with centimeter scan range and submicron resolution. Dinner, Rafael B.; Beasley, M. R.; Moler, Kathryn A. // Review of Scientific Instruments;Oct2005, Vol. 76 Issue 10, p104301 

    We have constructed a scanning Hall-probe microscope that combines a 1⊗4 cm scan range with 200 nm positioning resolution by coupling stepper motors to high-resolution drivers and reducing gears. The instrument is uniquely suited for efficient magnetic imaging of mesoscopic devices, media,...

  • The flexible and modern open source scanning probe microscopy software package GXSM. Zahl, Percy; Bierkandt, Markus; Schröder, Stefan; Klust, Andreas // Review of Scientific Instruments;Mar2003, Vol. 74 Issue 3, p1222 

    GXSM is a full featured and modem scanning probe microscopy (SPM) software. It can be used both in stand alone mode for powerful image processing and analysis and connected to an instrument operating many different flavors of SPM, e.g., scanning tunneling microscopy and atomic force microscopy...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics