TITLE

Ultrahigh vacuum scanning force/scanning tunneling microscope: Application to high-resolution

AUTHOR(S)
Olsson, L.; Wigren, R.; Erlandsson, R.
PUB. DATE
June 1996
SOURCE
Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2289
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents a combined scanning force/scanning tunneling microscope operating in ultrahigh vacuum using a fiber-optic laser interferometer to detect the lever deflection. Description of the force sensor; Cleaning of tips in situ using electron bombardment.
ACCESSION #
4295439

 

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