A new force controlled atomic force microscope for use in ultrahigh vacuum

Jarvis, S.P.; Yamada, H.; Yamamoto, S.-I.; Tokumoto, H.
June 1996
Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2281
Academic Journal
Reports on the introduction of a magnetic force controlled atomic force microscope and point contact probe for use in ultrahigh vacuum. Provision of quantitative information on the nature of tip-surface interaction; Enhancement of the current capabilities of scanning probe microscopes; Method for measuring the absolute force gradient or contact stiffness.


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