Tapping mode atomic force microscopy in liquid

Putman, Constant A.J.; Van der Werf, Kees O.; De Grooth, Bart G.; Van Hulst, Niek F.; Greve, Jan
May 1994
Applied Physics Letters;5/2/1994, Vol. 64 Issue 18, p2454
Academic Journal
Examines the use of silicon nitride cantilevers for tapping mode atomic force microscopy in liquid. Excitation of cantilevers by acoustic modes in the liquid; Disruptive influence of lateral forces on soft samples; Comparison between the cantilever resonance in air and liquid.


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