Origin of nonuniform properties of

Olsson, E.; Char, K.
March 1994
Applied Physics Letters;3/7/1994, Vol. 64 Issue 10, p1292
Academic Journal
Presents the characterization of YBa[sub 2]Cu[sub 3]O[sub 7-x]/CaRuO[sub 3]/YBa[sub 2]Cu[sub 3]O[sub 7-x] (YBCO) Josephson edge junctions. Use of the transmission electron microscopy; Observation of damages during the fabrication of the edges; Enhancement of Y[sub 2]O[sub 3] particle nucleation; Importance of the YBCO edge morphology.


Related Articles

  • Cross-sectional transmission electron microscopy observation of Nb/AlO[sub x]-Al/Nb Josephson... Imamura, Takeshi; Hasuo, Shinya // Applied Physics Letters;2/11/1991, Vol. 58 Issue 6, p645 

    Reports on a study of microstructure of Nb/AlO[sub x]-Al/Nb Josephson junctions by cross-sectional transmission electron microscopy that yielded information regarding the junction barrier region. Formation of polycrystalline films with columnar structures by both thick Nb and Al;...

  • Transmission electron microscope observation of a NbN/Nb oxide/NbN trilayer structure. Miyamoto, N.; Tarutani, Y.; Hirano, M.; Shimotsu, T.; Kawabe, U. // Journal of Applied Physics;9/15/1986, Vol. 60 Issue 6, p2187 

    Presents a study that described the fabrication of a NbN/Nb oxide/NbN Josephson junction and transmission electron microscopy observations of their cross-sectional structure. Correlation of junction characteristics with observed structures; Fabrication process of NbN/Nb oxide/NbN trilayer film;...

  • Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: Formation mechanisms and influences on electrical properties. Wu, Y.; Ishimaru, Y.; Wakana, H.; Adachi, S.; Tarutani, Y.; Tanabe, K. // Journal of Applied Physics;10/15/2002, Vol. 92 Issue 8, p4571 

    Interface-engineered ramp-edge Josephson junctions with different critical current values and different electrode materials are investigated by transmission electron microscopy. High- resolution transmission electron microscopic observations show the coexistence of Y[SUB2]O[SUB3],...

  • Microstructure of fine-grained Pb-alloy films for Josephson integrated circuits. Hasumi, Yuji; Waho, Takao // Journal of Applied Physics;1/15/1986, Vol. 59 Issue 2, p540 

    Examines the microstructure of lead-indium-gold alloy films using transmission electron microscopy, Auger-electron spectroscopy and X-ray diffraction in order to obtain fine-grained films for high reliability Josephson integrated circuits. Reason for the increase in thermal strain after thermal...

  • The atomic details of the interfacial interaction between the bottom electrode of Al/AlOx/Al Josephson junctions and HF-treated Si substrates. Zeng, L. J.; Krantz, P.; Nik, S.; Delsing, P.; Olsson, E. // Journal of Applied Physics;2015, Vol. 117 Issue 16, p163915-1 

    The interface between the Al bottom contact layer and Si substrates in Al based Josephson junctions is believed to have a significant effect on the noise observed in Al based superconducting devices. We have studied the atomic structure of it by transmission electron microscopy. An amorphous...

  • Electrical behavior of YBa2Cu3O7-x grain boundary junctions under low magnetic field. Nicoletti, S.; Villegier, J.-C. // Journal of Applied Physics;7/1/1997, Vol. 82 Issue 1, p303 

    Reports on the characterization of high temperature superconductor grain boundary junctions under a magnetic field in the mT range. Consideration of samples fabricated on symmetrical bi-crystal substrates; Electrical characterization; Josephson current of a given junction.

  • Supercurrent distributions and flux penetration in YBa2Cu3O7-YBa2Co0.15Cu2.85O7-YBa2Cu3O7 edge... Gausepohl, S.C.; Lee, Mark; Berkowitz, S. J.; Mallison, W. H. // Journal of Applied Physics;9/1/1997, Vol. 82 Issue 5, p2427 

    Focuses on the measurement and analysis of critical current modulation and microwave response in magnetic field for a set of YBa2Cu3O7-YBa2Co0.15Cu2.85O7-YBa2Cu3O7 ramp-edge Josephson junctions. Contribution from edge supercurrents; Addition of a superconducting ground plane; Modeling of the...

  • Fluxon dynamics in discrete Josephson transmission lines with stacked junctions. Caputo, P.; Darula, M.; Ustinov, A. V.; Kohlstedt, H. // Journal of Applied Physics;1/1/1997, Vol. 81 Issue 1, p309 

    Studies the properties of discrete Josephson multi-junction transmission lines (DMJTLs) based on double-barrier stacked junctions. Description of the fabrication technology of double-barrier DMJTLs; Distinct features of DMJTL; Possibility of multi-fluxon transfer through DMJTL.

  • The influence of the critical current spread on the frequency locking of Josephson junctions in... Laub, A.; Keck, M.; Doderer, T.; Huebener, R.P.; Traeuble, T.; Dolata, R.; Weimann, T.; Niemeyer, J. // Journal of Applied Physics;5/15/1998, Vol. 83 Issue 10, p5302 

    Provides information on an experiment examining two-dimensional arrays of overdamped Josephson junction under microwave irradiation. Importance on the absence of a voltage signal when an array with inhomogeneities is biased near its critical current; Influence of the current spread; Results of...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics