TITLE

Origin of nonuniform properties of

AUTHOR(S)
Olsson, E.; Char, K.
PUB. DATE
March 1994
SOURCE
Applied Physics Letters;3/7/1994, Vol. 64 Issue 10, p1292
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents the characterization of YBa[sub 2]Cu[sub 3]O[sub 7-x]/CaRuO[sub 3]/YBa[sub 2]Cu[sub 3]O[sub 7-x] (YBCO) Josephson edge junctions. Use of the transmission electron microscopy; Observation of damages during the fabrication of the edges; Enhancement of Y[sub 2]O[sub 3] particle nucleation; Importance of the YBCO edge morphology.
ACCESSION #
4294279

 

Related Articles

  • Cross-sectional transmission electron microscopy observation of Nb/AlO[sub x]-Al/Nb Josephson... Imamura, Takeshi; Hasuo, Shinya // Applied Physics Letters;2/11/1991, Vol. 58 Issue 6, p645 

    Reports on a study of microstructure of Nb/AlO[sub x]-Al/Nb Josephson junctions by cross-sectional transmission electron microscopy that yielded information regarding the junction barrier region. Formation of polycrystalline films with columnar structures by both thick Nb and Al;...

  • Transmission electron microscope observation of a NbN/Nb oxide/NbN trilayer structure. Miyamoto, N.; Tarutani, Y.; Hirano, M.; Shimotsu, T.; Kawabe, U. // Journal of Applied Physics;9/15/1986, Vol. 60 Issue 6, p2187 

    Presents a study that described the fabrication of a NbN/Nb oxide/NbN Josephson junction and transmission electron microscopy observations of their cross-sectional structure. Correlation of junction characteristics with observed structures; Fabrication process of NbN/Nb oxide/NbN trilayer film;...

  • Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: Formation mechanisms and influences on electrical properties. Wu, Y.; Ishimaru, Y.; Wakana, H.; Adachi, S.; Tarutani, Y.; Tanabe, K. // Journal of Applied Physics;10/15/2002, Vol. 92 Issue 8, p4571 

    Interface-engineered ramp-edge Josephson junctions with different critical current values and different electrode materials are investigated by transmission electron microscopy. High- resolution transmission electron microscopic observations show the coexistence of Y[SUB2]O[SUB3],...

  • Microstructure of fine-grained Pb-alloy films for Josephson integrated circuits. Hasumi, Yuji; Waho, Takao // Journal of Applied Physics;1/15/1986, Vol. 59 Issue 2, p540 

    Examines the microstructure of lead-indium-gold alloy films using transmission electron microscopy, Auger-electron spectroscopy and X-ray diffraction in order to obtain fine-grained films for high reliability Josephson integrated circuits. Reason for the increase in thermal strain after thermal...

  • The atomic details of the interfacial interaction between the bottom electrode of Al/AlOx/Al Josephson junctions and HF-treated Si substrates. Zeng, L. J.; Krantz, P.; Nik, S.; Delsing, P.; Olsson, E. // Journal of Applied Physics;2015, Vol. 117 Issue 16, p163915-1 

    The interface between the Al bottom contact layer and Si substrates in Al based Josephson junctions is believed to have a significant effect on the noise observed in Al based superconducting devices. We have studied the atomic structure of it by transmission electron microscopy. An amorphous...

  • Electrical behavior of YBa2Cu3O7-x grain boundary junctions under low magnetic field. Nicoletti, S.; Villegier, J.-C. // Journal of Applied Physics;7/1/1997, Vol. 82 Issue 1, p303 

    Reports on the characterization of high temperature superconductor grain boundary junctions under a magnetic field in the mT range. Consideration of samples fabricated on symmetrical bi-crystal substrates; Electrical characterization; Josephson current of a given junction.

  • Supercurrent distributions and flux penetration in YBa2Cu3O7-YBa2Co0.15Cu2.85O7-YBa2Cu3O7 edge... Gausepohl, S.C.; Lee, Mark; Berkowitz, S. J.; Mallison, W. H. // Journal of Applied Physics;9/1/1997, Vol. 82 Issue 5, p2427 

    Focuses on the measurement and analysis of critical current modulation and microwave response in magnetic field for a set of YBa2Cu3O7-YBa2Co0.15Cu2.85O7-YBa2Cu3O7 ramp-edge Josephson junctions. Contribution from edge supercurrents; Addition of a superconducting ground plane; Modeling of the...

  • Fluxon dynamics in discrete Josephson transmission lines with stacked junctions. Caputo, P.; Darula, M.; Ustinov, A. V.; Kohlstedt, H. // Journal of Applied Physics;1/1/1997, Vol. 81 Issue 1, p309 

    Studies the properties of discrete Josephson multi-junction transmission lines (DMJTLs) based on double-barrier stacked junctions. Description of the fabrication technology of double-barrier DMJTLs; Distinct features of DMJTL; Possibility of multi-fluxon transfer through DMJTL.

  • The influence of the critical current spread on the frequency locking of Josephson junctions in... Laub, A.; Keck, M.; Doderer, T.; Huebener, R.P.; Traeuble, T.; Dolata, R.; Weimann, T.; Niemeyer, J. // Journal of Applied Physics;5/15/1998, Vol. 83 Issue 10, p5302 

    Provides information on an experiment examining two-dimensional arrays of overdamped Josephson junction under microwave irradiation. Importance on the absence of a voltage signal when an array with inhomogeneities is biased near its critical current; Influence of the current spread; Results of...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics