TITLE

Thermal stability of titanium hydride thin films

AUTHOR(S)
Chatbi, H.; Vergnat, M.; Marchal, G.
PUB. DATE
March 1994
SOURCE
Applied Physics Letters;3/7/1994, Vol. 64 Issue 10, p1210
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Investigates the thermal stability of titanium hydride thin films by reactive evaporation. Use of the effusion method to monitor the release of hydrogen; Representation of two peaks in the gas evolution spectrum; Analysis of titanium hydride films in terms of the three potential rate-limiting steps.
ACCESSION #
4294223

 

Related Articles

  • Thermal behavior of nickel-metal hydride battery during charging at a wide range of ambient temperatures. Fang, Kai; Mu, Dao; Chen, Shi; Wu, Feng; Zeng, Xiao // Journal of Thermal Analysis & Calorimetry;Jul2011, Vol. 105 Issue 1, p383 

    The thermal behavior of D-type Ni-MH battery during charging was investigated at a wide range of ambient temperatures in this work. The temperature measurement of the battery was conducted by using a thermal infrared imager put in a high-low temperature chamber. The ambient temperatures were...

  • Thermal diffusivity measurement of polymeric thin films using the photothermal displacement... Ogawa, Ennis T. // Journal of Applied Physics;12/1/1999, Vol. 86 Issue 11, p6018 

    Part I. Deals with a study which used the photothermal displacement technique in measuring the out-of-plane thermal diffusivity in free-standing polymer thin films. Theoretical framework of the study; Description of the experimental setup of the study; Description of the displacement slope...

  • Ultralow-dark-current wafer-bonded Si/InGaAs photodetectors. Levine, B. F.; Pinzone, C. J. // Applied Physics Letters;10/4/1999, Vol. 75 Issue 14, p2141 

    Discusses a method of wafer bonding which significantly reduces the thermal expansion mismatch stress by removing the substrate before the high temperature anneal thereby allowing elastic accommodation of the thin device layers. Bonding procedure; Order of magnitude improvement in the dark...

  • Unusually high thermal conductivity in diamond films. Graebner, J.E.; Jin, S. // Applied Physics Letters;3/30/1992, Vol. 60 Issue 13, p1576 

    Demonstrates a very high thermal conductivity in chemical-vapor-deposited (CVD) polycrystalline diamond thin film. Observation of factor of four through thickness gradient in thermal conductivity; Dependence of thermal conductivity on microstructure; Implication for thermal management of...

  • Origin of asymmetric growth during solid-state amorphization studied with molecular-dynamics simulation. Zhang, Q.; Lai, W. S. // Journal of Applied Physics;6/1/2000, Vol. 87 Issue 11, p7696 

    Presents a study which investigated a solid-state interfacial reaction or amorphization in some type of thin films upon thermal annealing with molecular-dynamics simulation. Origin of the asymmetric growth; Conclusion.

  • Magneto-infrared spectra of matrix-isolated NiH and NiH[sub 2] molecules and theoretical... Li, S.; Van Lee, R. J. // Journal of Chemical Physics;2/8/1997, Vol. 106 Issue 6, p2055 

    Discusses observations of two vibronic transitions for nickel hydride in solid argon and krypton. Ground state vibrational frequency in neon, argon and krypton matrices; Implication that the molecule is strongly bent in its ground electronic state; Agreement of the calculated structural and...

  • Theoretical spectroscopic parameters for the low-lying states of the second-row transition metal hydrides. Langhoff, Stephen R.; Pettersson, Lars G. M.; Bauschlicher, Charles W.; Partridge, Harry // Journal of Chemical Physics;1/1/1987, Vol. 86 Issue 1, p268 

    Spectroscopic parameters (De,re,μe) are determined for the second-row transition metal hydrides using large valence basis sets in conjunction with relativistic effective core potentials (RECPs). All-electron calculations are also performed for YH and AgH to calibrate the RECP results....

  • Emission spectra of TiH and TiD near 938 nm. Andersson, Nils; Balfour, Walter J.; Bernath, Peter F.; Lindgren, Bo; Ram, Ram S. // Journal of Chemical Physics;2/22/2003, Vol. 118 Issue 8, p3543 

    High resolution, near infrared emission spectra of TiH and TiD have been recorded with a Fourier transform spectrometer. The TiH and TiD molecules were made in a titanium hollow cathode lamp operated with a mixture of neon and hydrogen or deuterium gases. A heavily perturbed band system near 938...

  • An analysis of the heat-pulse method for thermal-transport measurements of thin films. Bortner, L. J.; Newrock, R. S.; Resnick, D. J. // Journal of Applied Physics;5/1/1987, Vol. 61 Issue 9, p4452 

    Analyzes heat-pulse method of measuring the thermal conductivity and specific heat of thin films. Details on the cable equations; Information on the Laplace inversion of the cable equations; Conclusion.

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics