TITLE

Photoamperic probes in scanning tunneling microscopy

AUTHOR(S)
Prins, M.W.J.; van der Wielen, M.C.M.M.; Jansen, R.; Abraham, D.L.; van Kempen, H.
PUB. DATE
March 1994
SOURCE
Applied Physics Letters;3/7/1994, Vol. 64 Issue 10, p1207
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Investigates the sensitivity of the semiconductor scanning tunneling microscope (STM) tips to an incident optical field. Characteristics of the semiconductor STM tip; Representation of the surface photovoltage under steady-state photoexcitation; Adjustment of the STM junction to obtain a photovoltaic or photoamperic behavior.
ACCESSION #
4294218

 

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