Photoamperic probes in scanning tunneling microscopy

Prins, M.W.J.; van der Wielen, M.C.M.M.; Jansen, R.; Abraham, D.L.; van Kempen, H.
March 1994
Applied Physics Letters;3/7/1994, Vol. 64 Issue 10, p1207
Academic Journal
Investigates the sensitivity of the semiconductor scanning tunneling microscope (STM) tips to an incident optical field. Characteristics of the semiconductor STM tip; Representation of the surface photovoltage under steady-state photoexcitation; Adjustment of the STM junction to obtain a photovoltaic or photoamperic behavior.


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