Cross-sectional scanning tunneling microscopy of doped and undoped AlGaAs/GaAs heterostructures

Gwo, S.; Chao, K.-J.; Shih, C.K.
January 1994
Applied Physics Letters;1/24/1994, Vol. 64 Issue 4, p493
Academic Journal
Demonstrates a method to prepare cross-sectional surfaces ex situ for scanning tunneling microscopy (STM) studies of semiconductor heterostructures. Capability in preparing a cross-sectional surface ex situ; Technical difficulties in x-sectional STM; Performance of x-sectional STM studies in undoped regions.


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