TITLE

Strain distribution in InP/InGaAs superlattices determined by high resolution x-ray diffraction

AUTHOR(S)
Krost, A.; Bohrer, J.; Roehle, H.; Bauer, G.
PUB. DATE
January 1994
SOURCE
Applied Physics Letters;1/24/1994, Vol. 64 Issue 4, p469
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Evaluates interfacial strain distribution in a short period InP/InGaAs superlattice structure by high resolution x-ray diffraction. Determination of interfacial strain distribution; Introduction of positively and negatively strained interfacial monolayers.
ACCESSION #
4294179

 

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