Strain distribution in InP/InGaAs superlattices determined by high resolution x-ray diffraction

Krost, A.; Bohrer, J.; Roehle, H.; Bauer, G.
January 1994
Applied Physics Letters;1/24/1994, Vol. 64 Issue 4, p469
Academic Journal
Evaluates interfacial strain distribution in a short period InP/InGaAs superlattice structure by high resolution x-ray diffraction. Determination of interfacial strain distribution; Introduction of positively and negatively strained interfacial monolayers.


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