Numerical study of temperature effect on carrier dynamics in multiple quantum well narrow wires

Endoh, Akira; Arimoto, Hiroshi; Sugiyama, Yoshishiro; Kitada, Hideki; Muto, Shunichi
January 1994
Applied Physics Letters;1/24/1994, Vol. 64 Issue 4, p448
Academic Journal
Demonstrates the numerical calculations of carrier dynamics in multiple quantum well narrow wires using a simple model with damage effects. Effect of temperature on the dependence of decay time on wire width; Change in the decay time; Localization of carriers at low temperature.


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