Scanning electro-optical and pyroelectrical microscopy for the investigation of polarization

Yilmaz, S.; Bauer, S.; Wirges, W.; Gerhard-Multhaupt, R.
September 1993
Applied Physics Letters;9/27/1993, Vol. 63 Issue 13, p1724
Academic Journal
Proposes a compact and simple experimental setup for scanning pyroelectrical and electro-optical microscopy. Demonstration of the feasibility of the setup; Ease of using the scanning pyroelectrical microscope; Exhibition of better spatial resolution and higher contrasts by the scanning electro-optical microscope.


Related Articles

  • Resolution for life. CZYZEWSKI, ANDREW // Engineer (00137758);3/14/2011, Vol. 296 Issue 7812, p14 

    The article reports on the success of scientists in increasing the resolution of a standard optical microscope by 20 times, which allows the possibility of directly observing living cellular processes in Great Britain.

  • Measurement of the 4Pi-confocal point spread function proves 75 nm axial resolution. Hell, S.W.; Lindek, S.; Cremer, C.; Stelzer, E.H.K. // Applied Physics Letters;3/14/1994, Vol. 64 Issue 11, p1335 

    Examines the point spread functions of 4Pi-confocal and confocal microscopes. Illumination of the 4Pi-confocal microscope to increase the numerical aperture; Measurement of the device functions; Implication of axial resolution for the three-dimensional imaging technique.

  • Enhancing the Spatial Resolution of Photothermal Microscopy. Luk�yanov, A. Yu. // Technical Physics Letters;Dec2000, Vol. 26 Issue 12, p1093 

    It is demonstrated theoretically that the spatial resolution of the photothermal microscopy can be increased to the level of optical microscopy if the image is produced by a spatially modulated heating laser beam.

  • A high-resolution scanning Kelvin probe microscope for contact potential measurements on the 100... Nabhan, W.; Equer, B.; Broniatowski, A.; De Rosny, G. // Review of Scientific Instruments;Aug1997, Vol. 68 Issue 8, p3108 

    Describes the principles and performance of a scanning Kelvin probe microscope for contact potential measurements with a lateral resolution on the 100 nanometer scale and a sensitivity in the millivolt range. Design and manufacture of guarded microelectrodes; Probe system and control circuitry;...

  • Assessing the resolution limits of scanning spreading resistance microscopy and scanning capacitance microscopy. Eyben, P.; Duhayon, N.; Alvarez, D.; Vandervorst, W. // AIP Conference Proceedings;2003, Vol. 683 Issue 1, p678 

    Within this paper we present a general study on the resolution limits of scanning spreading resistance microscopy (SSRM) and scanning capacitance microscopy (SCM). The definition of the resolution concept is not straightforward for carrier profiling techniques and has to be divided into three...

  • Near field emission scanning tunneling microscopy. Saenz, Juan Jose; Garcia, Ricardo // Applied Physics Letters;12/5/1994, Vol. 65 Issue 23, p3022 

    Evaluates the operation of the scanning tunneling microscope (STM) in the near field emission regime. Prediction of subatomic resolution in a direction normal to the surface; Calculation of the effective width of a monoatomic step at constant current; Application of the STM mode.

  • Just-on-surface magnetic force microscopy. Hosaka, Sumio; Kikukawa, Atsushi; Honda, Yukio; Hasegawa, Tsuyoshi // Applied Physics Letters;12/26/1994, Vol. 65 Issue 26, p3407 

    Proposes a just-on-surface magnetic force microscope for advanced spatial resolution of the magnetic stray field image. Resolution images provided; Ability to observe a localized surface magnetic stray field caused by magnetization; Comparison with the conventional magnetic force microscope.

  • Vertical two-dimensional piezoelectric inertial slider for scanning tunneling microscope. Libioulle, L.; Ronda, A.; Derycke, I.; Vigneron, J. P.; Gilles, J. M. // Review of Scientific Instruments;Jun93, Vol. 64 Issue 6, p1489 

    To achieve both high stability during scanning tunneling microscopy (STM) measurements at atomic resolution and long-range imaging of nonhomogeneous samples, we have developed a fully 2D vertical inertial nanopositioner which allows tunneling tip displacements in the 0.011000 µm range while...

  • Nonlinear scanning laser microscopy by third harmonic generation. Barad, Y.; Eisenberg, H. // Applied Physics Letters;2/24/1997, Vol. 70 Issue 8, p922 

    Presents a method for nonlinear scanning laser microscopy using third harmonic generation. Effectiveness in resolving interfaces and inhomogeneities with axial resolution comparable to beam confocal length; Resolution of resolved interfaces using 120 femtosecond pulses at 1.5 micrometer;...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics