Method of determining metal contamination by combining p-type Si and n-type Si recombination

Itsumi, Manabu
August 1993
Applied Physics Letters;8/23/1993, Vol. 63 Issue 8, p1095
Academic Journal
Proposes a method of determining metal contamination by combining p-type and n-type silicon recombination lifetime measurements. Presence of trends in the relation between silicon lifetime measurements; Use of the trends in estimating metallic impurities; Distribution of the lifetime data near the stainless-steel line.


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