TITLE

Photoreflectance characterization of an InP/InGaAs heterojunction bipolar transistor structure

AUTHOR(S)
Yan, D.; Pollak, Fred H.; Boccio, V.T.; Lin, C.L.; Kirchner, P.D.; Woodall, J.M.; Gee, Russell C.; Asbeck, Peter M.
PUB. DATE
October 1992
SOURCE
Applied Physics Letters;10/26/1992, Vol. 61 Issue 17, p2066
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the photoreflectance spectrum from a lattice-matched InP/InGaAs heterojunction bipolar transistor. Application of gas-source molecular beam epitaxy; Evaluation of the built-in direct current electric fields; Verification of the lattice-matched nature of the system.
ACCESSION #
4293983

 

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