Ion channeling and x-ray diffraction study of tensely strained GaInP layers on InP

Cohen, G. M.; Ritter, D.
January 1999
Applied Physics Letters;1/4/1999, Vol. 74 Issue 1, p43
Academic Journal
Presents an ion channeling and x-ray diffraction study of tensely strained GaInP layers on InP. Angular difference between the substrate and the layer channeling angles; Negligible relaxation.


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