TITLE

Fine temperature stabilizer for x-ray diffraction measurements

AUTHOR(S)
Kojima, A.; Ishii, C.; Tozaki, K.; Matsuda, S.; Nakayama, T.; Tsuda, N.; Yoshimura, Y.; Iwasaki, H.
PUB. DATE
June 1997
SOURCE
Review of Scientific Instruments;Jun97, Vol. 68 Issue 6, p2301
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents a simple and versatile method of high-temperature stability for x-ray diffraction measurements near room temperature. Small sample cell for the measurements; Highest stability of the temperature control for x-ray diffraction studies; Results of the temperature stability in the cell.
ACCESSION #
4290501

 

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