TITLE

Fine temperature stabilizer for x-ray diffraction measurements

AUTHOR(S)
Kojima, A.; Ishii, C.; Tozaki, K.; Matsuda, S.; Nakayama, T.; Tsuda, N.; Yoshimura, Y.; Iwasaki, H.
PUB. DATE
June 1997
SOURCE
Review of Scientific Instruments;Jun97, Vol. 68 Issue 6, p2301
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents a simple and versatile method of high-temperature stability for x-ray diffraction measurements near room temperature. Small sample cell for the measurements; Highest stability of the temperature control for x-ray diffraction studies; Results of the temperature stability in the cell.
ACCESSION #
4290501

 

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics