Production of multicharged radioactive ion beams: The 1[sup +] + n[sup +] charge state

Tamburella, C.; Belmont, J.L.; Bizouard, G.; Bruandet, J.F.; Geller, R.; Gimond, G.; Vignon, B.
June 1997
Review of Scientific Instruments;Jun97, Vol. 68 Issue 6, p2319
Academic Journal
Describes the development of two types of ion conversion devices for the Production, Ionisation, Acceleration de Faisceaux Exotiques project. Use of the devices for short-lived radioactive ions beams; Principle of plasma capture; Backward injection mode.


Related Articles

  • new products.  // Physics Today;Mar80, Vol. 33 Issue 3, p123 

    Evaluates several scientific instruments for use in various fields related to physics. Mini Beam II ion gun; Keithley's model-619 dual-channel electrometer/multimeter; Electrooptical devices from Lasermetrics.

  • Effect of ion beam irradiation on the structure of ZnO films deposited by a dc arc plasmatron. Penkov, Oleksiy V.; Lee, Heon-Ju; Plaksin, Vadim Yu.; Ko, Min Gook; Joa, Sang Beom; Yim, Chan Joo // Review of Scientific Instruments;Feb2008, Vol. 79 Issue 2, p02C504 

    The deposition of polycrystalline ZnO film on a cold substrate was performed by using a plasmatron in rough vacuum condition. Low energy oxygen ion beam generated by a cold cathode ion source was introduced during the deposition process. The change of film property on the ion beam energy was...

  • Focused ion-beam direct deposition of metal thin film. Nagamachi, Shinji; Yamakage, Yasuhiro; Ueda, Masahiro; Maruno, Hiromasa; Ishikawa, Junzo // Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2351 

    Reports on the development of focused ion-beam direct deposition as a method for fabricating patterned metal films directly on substrates. Performance of ion-beam deposition by low-energy focused ion beams; Estimated beam diameter; Measurement of the purity of the gold film using Auger electron...

  • A beam line for highly charged ions. Pikin, A.I.; Morgan, C.A.; Bell, E.W.; Ratliff, L.P.; Church, D.A.; Gillaspy, J.D. // Review of Scientific Instruments;Jul96, Vol. 67 Issue 7, p2528 

    Describes the design and operation of a beam line for transporting and charge-to-mass selecting highly charged ions extracted from the National Institute of Standards and Technology electron beam ion trap (EBIT). Production of pure beams of low-energy, highly charged ions; Design choices and...

  • An apparatus for glancing incidence ion beam polishing and characterization of surfaces to... Wissing, M.; Holzwarth, M.; Simeonova, D.S.; Snowdon, K.J. // Review of Scientific Instruments;Dec1996, Vol. 67 Issue 12, p4314 

    Describes an instrument which combines a glancing incidence ion beam erosion system with a scanning tunneling and an atomic force microscope. Allowing the ion beam polishing and surface topographic characterization of samples under ultrahigh vacuum conditions; Vacuum system and vibration...

  • Collinear laser and slow-ion-beam apparatus for high-precision laser-rf double-resonance spectroscopy. Sen, A.; Goodman, L. S.; Childs, W. J. // Review of Scientific Instruments;Jan1988, Vol. 59 Issue 1, p74 

    A new apparatus has been constructed for high-precision hyperfine structure measurement of atomic ions by laser-radio-frequency double-resonance technique involving a slow ion beam and a laser in collinear geometry. The low ion energy (1–1.5 keV) leads to longer interaction time with the...

  • Crystal adjustment by means of blocking pattern. Ellmer, H.; Aichinger, R.; Winkler, E.; Semrad, D.; Mergel, V.; Jagutzki, O. // Review of Scientific Instruments;Jul2000, Vol. 71 Issue 7 

    A facility is described to record the blocking pattern of a single crystal produced by 400 keV protons. By this we aim at a reliable, fast, and careful procedure to align single crystals to the incoming ion beam. The two-dimensional position sensitive detector (2D-PSD) system from Roentdek GmbH...

  • Ion source for production of metastable He+(2S1/2) ions. Dunford, R. W.; Dewey, M. S. // Review of Scientific Instruments;Mar88, Vol. 59 Issue 3, p443 

    The construction and performance of an electron bombardment ion source designed to produce a beam of low-energy (100–400 eV) singly ionized helium (He+) with a significant fraction of ions in the metastable 2S1/2 state is described. The source operates in the fringe field of a magnet and...

  • Thomson parabola ion energy analyzer with a coincident and jitter-free applied electric field ramp. Yoneda, H.; Horioka, K.; Kim, Y.; Kasuya, K. // Review of Scientific Instruments;Mar88, Vol. 59 Issue 3, p457 

    A simple Thomson parabola ion energy analyzer for intense pulsed ion beam is demonstrated. Beam ions collimated by two apertures, are deflected by a time ramping electric field and a static magnetic field. The ramping electric field is produced with a stacked cable pulser powered by a voltage...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics